| Titre : |
Experimental Techniques for Low-Temperature Measurements : Cryostat Design, Material Properties and Superconductor Critical-Current Testing |
| Type de document : |
texte imprimé |
| Auteurs : |
Jack W. Ekin, Auteur |
| Editeur : |
New York : Oxford University Press |
| Année de publication : |
2006 |
| Importance : |
XXVIII-673 P. |
| Présentation : |
Relie, couv. ill en coul., graph, ill. |
| Format : |
24 cm |
| ISBN/ISSN/EAN : |
978-0-19-857054-7 |
| Langues : |
Anglais (eng) |
| Catégories : |
06.00 Metrology, measurements, and laboratory procedures
|
| Mots-clés : |
Low temperature techniques Temperature measurement of Cryogenics Thermodynamic properties of superconductors Critical currents superconductivity |
| Index. décimale : |
06.00 |
| Résumé : |
Part I : Cryostat Design and Materials Selection. - 1 Introduction to Measurement Cryostats and Cooling Methods. - 2 Heat Transfer at Cryogenic Temperatures. - 3 Cryostat Construction. - 4 Wiring and Connections. - 5 Temperature Measurement and Control. - 6 Properties of Solids at Low Temperatures. - Part II : Electrical Transport Measurements: Sample Holders and Contacts. - 7 Sample Holders. - 8 Sample Contacts. - Part III : Superconductor Critical-Current Measurements and Data Analysis. - 9 Critical-Current Measurements. - 10 Critical-Current Data Analysis |
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