| Titre : |
Light and X-Ray Optics : Refraction, Reflection, Diffraction, Optical Devices, Microscopic Imaging |
| Type de document : |
texte imprimé |
| Auteurs : |
Emil Zolotoyabko, Auteur |
| Editeur : |
Berlin : de Gruyter |
| Année de publication : |
2023 |
| Importance : |
XII-286 P. |
| Présentation : |
Broché. Couv. ill. en coul., fig., graph |
| Format : |
23 cm |
| ISBN/ISSN/EAN : |
978-3-11-113969-2 |
| Langues : |
Anglais (eng) |
| Catégories : |
(42.00) Optique et lasers
|
| Mots-clés : |
Optics Lenses Light Diffraction Diffraction x ray |
| Index. décimale : |
42.00 |
| Résumé : |
1 Foundations of geometrical optics. - 2 Fermat’s principle: light reflection and refraction. - 3 Fermat’s principle: focusing of visible light and X-rays. - 4 Refractive index in anisotropic crystals. - 5 Polarization, birefringence, and related phenomena. - 6 Strong frequency effects in light optics. - 7 Interference phenomena. - 8 Light and X-ray interferometers. - 9 Phase-contrast microscopy. - 10 Fraunhofer diffraction. - 11 Beyond diffraction limit. - 12 Fresnel diffraction. - 13 Optics of dynamical diffraction. - 14 Dynamical diffraction of quantum beams: basic principles. - 15 Specific features of dynamical X-ray diffraction. - 16 Optical phenomena in photonic structures |
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